CETEMMSA has various techniques for characterising surfaces:
- Perfilometry.- Measures the thickness of the layer and the roughness of the surface.
- Contact angle.- Calculates the wettability of a solid surface by a liquid by measuring the static or dynamic angle of contact and determining the surface energy of the substrates.
- FTIR spectroscopy.- Obtains IR spectrums in the 7800-300 cm-1wave numbers range, by transmission and reflection. The grazing angle accessory makes it possible to make IRRAS measurements of very thin layers.
- UV-Vis-NIR spectrophotometry.- Measures absorbance in the 180-3300 nm wavelength range. Measures absorbance, reflectance and colourimetry of both liquid and solid samples.
- Optic microscopy.- Visualisation of the surface with 5-100X magnification.
- Measurement of I-V transport: Equipment for characterising electronic devices.
- Spectrophotometry with CCD detection for measuring light emission.
The technology centres facilities also include a climate chamber for simulating environmental conditions (humidity and temperature trials) and a DMA for carrying out dynamic mechanical analyses of the finished devices and their materials.
